Face recognition with illumination, pose and expression variations using SIFT method

被引：0

作者：

Ge, Wei ^{[1
]}

Cai, Lijuan ^{[1
]}

Zhan, Weida ^{[1
]}

机构：

[1] Changchun Univ Sci & Technol, Sch Elect & Informat Engn, Changchun 130000, Peoples R China

来源：

PROCEEDINGS OF THE FIRST INTERNATIONAL CONFERENCE ON INFORMATION SCIENCES, MACHINERY, MATERIALS AND ENERGY (ICISMME 2015) | 2015年 / 126卷

关键词：

PIE conditions; face recognition; SIFT feature; match;

D O I：

暂无

中图分类号：

TP39 [计算机的应用];

学科分类号：

081203 ; 0835 ;

摘要：

Prior research has shown that under the illumination controlled and user cooperative conditions, nearly all of face recognition method perform very well, but when it comes to the variant illumination, pose and expression (PIE) conditions, the performance of these methods degrade seriously. Face recognition in variant PIE conditions is one of the most challenging problem in this field. In this paper, a method based on SIFT features is used to research on face recognition in variable PIE conditions. Three professional PIE-variable face database are used to experiment the performance of SIFT method. The experiment results show the huge potential of SIFT method in application to face recognition in variable PIE conditions.

引用

页码：688 / 691

页数：4

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