Analysis of dislocation - Induced lattice misorientations in distorted crystals by X-ray diffraction and EBSD

The evolution of dislocation-induced lattice misorientations in Ni single crystals and polycrystalline Al during compression tests at room temperature was studied by means of EBSD and the broadening of X-ray rocking curves (Ni). It is shown that the misorientation values of both procedure reveal some differences, which is reduced taking into account misorientation correlation between adjacent dislocation cells or cell blocks by its calculation from X-ray rocking curve and by projection spatial misorientation vector onto X ray rocking plane.