Secondary electron emission from freely supported nanowires

被引：19

作者：

Suzuki, Makoto ^{[1
,2
]}

Kumagai, Kazuhiro ^{[1
,2
]}

Sekiguchi, Takashi ^{[1
,2
]}

Cassell, Alan M. ^{[3
]}

Saito, Tsutomu ^{[4
]}

Yang, Cary Y. ^{[4
]}

机构：

[1] Univ Tsukuba, Grad Sch Pure & Appl Sci, Tsukuba, Ibaraki 3058577, Japan

[2] Natl Inst Mat Sci, Ibaraki 3050044, Japan

[3] NASA, Ames Res Ctr, Moffett Field, CA 94035 USA

[4] Santa Clara Univ, Ctr Nanostruct, Santa Clara, CA 95053 USA

来源：

JOURNAL OF APPLIED PHYSICS | 2008年 / 104卷 / 11期

关键词：

D O I：

10.1063/1.3032910

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

We present secondary electron (SE) emission results from freely supported carbon/silicon nitride (Si(3)N(4)) hybrid nanowires using scanning electron microscopy. We found that, contrary to bulk materials, the SE emission from insulating or electrically isolated metallic nanowires is strongly suppressed by the penetrating beam. A mechanism of the SE suppression by the positive specimen charging is proposed, which is based on a total emission yield calculation using the Monte Carlo technique. This finding provides an important basis for studying low-energy electron emission from nanostructures under a penetrating electron beam. (C) 2008 American Institute of Physics. [DOI: 10.1063/1.3032910]

引用

页数：6

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