Verification coverage: when is enough, enough?

被引:1
|
作者
Bacchini, Francine [1 ]
Hu, Alan J. [2 ]
Fitzpatrick, Tom [3 ]
Lacey, David [4 ]
Piziali, Andrew [5 ]
Ranjan, Rajeev [6 ]
Tan, Mercedes [7 ]
Ziv, Avi [8 ]
机构
[1] Francine Bacchini Inc, San Jose, CA USA
[2] Univ British Columbia, Vancouver, BC, Canada
[3] Mentor Graph Corp, San Jose, CA USA
[4] Hewlett Packard Corp, Richardson, TX USA
[5] Cadence Design Syst, Parker, TX USA
[6] Jasper Design Automat, Mountain View, CA USA
[7] Sun Microsyst, Sunnyvale, CA USA
[8] IBM Corp, Haifa, Israel
关键词
design verification; verification test plan; functional simulation; formal verification; coverage;
D O I
10.1109/DAC.2007.375262
中图分类号
TP301 [理论、方法];
学科分类号
081202 ;
摘要
引用
收藏
页码:744 / +
页数:2
相关论文
共 50 条