Sliding DFT-Based Fault Location Scheme for DC Microgrid

被引:6
|
作者
Wakode, Sarvesh A. [1 ]
Ballal, Makarand S. [1 ]
Deshmukh, Rohit R. [1 ]
机构
[1] Visvesvaraya Natl Inst Technol, Dept Elect Engn, Nagpur 440010, Maharashtra, India
关键词
Circuit faults; Microgrids; Fault location; Resistance; Discrete Fourier transforms; Impedance; Voltage; DC circuit breaker; discrete Fourier transform (DFT); distributed generation; fault resistance; intelligent electronic devices (IEDs); sliding DFT; PROTECTION SCHEME;
D O I
10.1109/TIA.2022.3189610
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Nowadays, the dc microgrid is getting much more attention due to its numerous advantages. However, accurate and timely detection of a fault and its location is still challenging. This article proposes a fast and effective fault identification and localization scheme for dc microgrids. This article implements the dc component concept to detect and locate the fault. The sliding discrete Fourier transform technique is used for the computation of dc components. At the first stage, the fault is identified by noticing the change in the direction of both the end current signals. In the second stage, the fault point resistance is estimated. Finally, in the third stage, the location of the fault is determined. The proposed methodology is implemented in real-time on the LabVIEW platform. The testing is performed for different types of faults at various fault locations considering distant topologies of the dc microgrid.
引用
收藏
页码:5944 / 5954
页数:11
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