Quantitative secondary ion mass spectrometry depth profiling of surface layers of cubic silver halide microcrystals

The present article describes depth-profiling studies on populations of cubic silver halide microcrystals (typical size between 400 and 600 nm). These crystals consist of mixed halides (Cl, Br, I) and are characterized by internal halide distributions such as core-shell structures. Determination of the spatial distribution of the different halides in the microcrystals offers valuable information for the optimization of the crystal design of new photographic materials. The first part describes the calibration of the sputtered depth, which is more complicated than in the one-dimensional case of flat surfaces. In a second part, three different quantification methods [halide intensity ratios, XCs2+ detection (X = halide) and the infinite velocity method] are used to determine the mean composition of the surface layer as a function of sputtered depth in the silver halide crystals. Although particles of submicrometer size are obviously not the ideal samples for depth profiling, a good correlation with values obtained by scanning electron microscopy energy dispersive X-ray microanalysis and wavelength dispersive X-ray fluorescence bulk analysis could be achieved. (J Am Soc Mass Spectrom 1999, 10, 1016-1027) (C) 1999 American Society for Mass Spectrometry.