Characterization of Electroluminescence from One-Dimensionally Self-Aligned Si-Based Quantum Dots

被引:2
|
作者
Takami, Hiroki [1 ]
Makihara, Katsunori [1 ]
Ikeda, Mitsuhisa [2 ]
Miyazaki, Seiichi [1 ]
机构
[1] Nagoya Univ, Grad Sch Engn, Nagoya, Aichi 4648603, Japan
[2] Hiroshima Univ, Grad Sch Adv Sci Matter, Higashihiroshima, Hiroshima 7398530, Japan
关键词
SILICON NANOCRYSTALS; ASSEMBLING FORMATION; CHARGE-TRANSPORT;
D O I
10.7567/JJAP.52.04CG08
中图分类号
O59 [应用物理学];
学科分类号
摘要
We have demonstrated self-assembling formation of one-dimensionally self-aligned Si-based quantum dots (QDs) structures and applied them to an active layer of light emitting diodes (LEDs) with a semitransparent Au gate. Under forward bias conditions over threshold biases as low as similar to 1.2 and similar to-2.0 V for LEDs formed on n- and p-Si(100), respectively, stable electroluminescence (EL) was observable in the near-infrared region at room temperature. The observed EL spectra could be deconvoluted into mainly two component peaks at similar to 1140 and similar to 1100 nm that originated from lower and upper dots, respectively, where both spectrum intensities showed a power-law relationship of the EL intensity with applied bias and input power. Notice that the slope of the component peak for the lower dots was larger than that for the upper dots, indicating that holes were stably stored in the lower dots due to a deep potential well. In fact, when an AC bias as low as similar to 6.4 V (DC at 2.0 V) was applied to the LEDs with an Au gate formed on the n-Si(100), a single component peak for the lower dots was detected, indicating electron-hole recombination in the lower dots caused by alternate carrier injection from the Si(100) substrate. (C) 2013 The Japan Society of Applied Physics
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页数:4
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