Scanning electron microscopy evaluation of the bonding mechanism of a self-etching primer on enamel

被引:0
|
作者
Cal-Neto, JP [1 ]
Miguel, JAM [1 ]
机构
[1] Univ Estado Rio De Janeiro, Dept Orthodont, BR-22541100 Rio De Janeiro, Brazil
关键词
phosphoric acid etching; scanning electron microscopy; self-etching primer;
D O I
暂无
中图分类号
R78 [口腔科学];
学科分类号
1003 ;
摘要
The aim of this study was to analyze the effect of a self-etching primer (Transbond Plus SEP, 3M Unitek, Monrovia, Calif), developed for orthodontic use, in the regularity and depth of adhesive infiltration in the enamel of human permanent teeth and to compare it with phosphoric acid using scanning electron microscopy (SEM). Thirty premolars were divided in two groups of 15 each: group 1(control)-phosphoric acid + Transbond XT Primer (3M Unitek) and group 2-Transbond Plus SEP. Transbond XT Adhesive Paste (3M Unitek) was used in both groups for bracket bonding. All products were used according to the manufacturer's instructions. Dental fragments were decalcified, and for micromorphologic observation of the adhesive penetration in enamel, the resin replicas, remnant at the base of the brackets, were covered with a thin gold layer and examined by SEM. Three calibrated examiners evaluated the photomicrographs and gave scores from 0 = without penetration to 2 = deep penetration. The Mann Whitney U-test (P < .0001) showed a statistical difference between the two groups. The results demonstrated that the SEP was more conservative and produced a smaller amount of demineralization and less penetration of adhesive in the enamel surfaces when compared with the conventional phosphoric acid system.
引用
收藏
页码:132 / 136
页数:5
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