Sharper focal spot below λ/4 of azimuthally polarized illumination phase-encoded by the binary 0/π phase plate
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作者:
Wang, Tingting
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Zhejiang Univ, State Key Lab Modern Opt Instrumentat, Hangzhou 310027, Zhejiang, Peoples R ChinaZhejiang Univ, State Key Lab Modern Opt Instrumentat, Hangzhou 310027, Zhejiang, Peoples R China
Wang, Tingting
[1
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Kuang, Cuifang
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Zhejiang Univ, State Key Lab Modern Opt Instrumentat, Hangzhou 310027, Zhejiang, Peoples R ChinaZhejiang Univ, State Key Lab Modern Opt Instrumentat, Hangzhou 310027, Zhejiang, Peoples R China
Kuang, Cuifang
[1
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Hao, Xiang
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Zhejiang Univ, State Key Lab Modern Opt Instrumentat, Hangzhou 310027, Zhejiang, Peoples R ChinaZhejiang Univ, State Key Lab Modern Opt Instrumentat, Hangzhou 310027, Zhejiang, Peoples R China
Hao, Xiang
[1
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Liu, Xu
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Zhejiang Univ, State Key Lab Modern Opt Instrumentat, Hangzhou 310027, Zhejiang, Peoples R ChinaZhejiang Univ, State Key Lab Modern Opt Instrumentat, Hangzhou 310027, Zhejiang, Peoples R China
Liu, Xu
[1
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机构:
[1] Zhejiang Univ, State Key Lab Modern Opt Instrumentat, Hangzhou 310027, Zhejiang, Peoples R China
The intensity distribution in the focal region for the azimuthally polarized beam phase-encoded by the binary 0/pi phase plate is calculated on the basis of the vector diffraction theory. With the annular pupil aperture employed, the resolution of the focal spot will be improved remarkably. We demonstrate a sharper focal spot with full width at half maximum (FWHM) of 0.223 lambda (below lambda/4), significantly smaller that of linear, circular and radial polarization beam under the same condition. The focusing phenomena for illumination beam with various polarization status and beam shapes are analyzed explicitly. This analysis could have potential applications in confocal microscopy and two-photo microscopy for polarization difference imaging. (C) 2011 Elsevier GmbH. All rights reserved.