Thermoelectric Properties Of SiO2/SiO2+Au Nano-Layered Superlattices Modified By MeV Si Ions Beam

被引:4
|
作者
Chacha, J. [1 ]
Budak, S. [1 ]
Smith, C. [2 ]
McElhaney, D. [1 ]
Pugh, M. [1 ]
Ogbara, K. [3 ]
Heidary, K. [1 ]
Johnson, R. B. [3 ]
Muntele, C. [2 ]
Ila, D. [2 ]
机构
[1] Alabama A&M Univ, Dept Elect Engn, 4900 Meridian St, Normal, AL 35762 USA
[2] Alabama A&M Univ, Cent Irradiat Mat, Normal, AL 35762 USA
[3] Alabama A&M Univ, Dept Phys, Normal, AL 35762 USA
基金
美国国家科学基金会;
关键词
Ion bombardment; thermoelectric properties; multi-nanolayers; Rutherford backscattering; Figure of merit;
D O I
10.1063/1.3586099
中图分类号
O59 [应用物理学];
学科分类号
摘要
The efficiency of thermoelectric devices and materials is limited by the properties of n- and p-type (semi) conductors. Effective thermoelectric materials have a low thermal conductivity and a high electrical conductivity. The performance of thermoelectric materials and devices is shown by a dimensionless figure of merit, The performance of thermoelectric materials and devices is shown by a dimensionless figure of merit, ZT = S-2 sigma T/K, where S is the Seebeck coefficient, sigma is the electrical conductivity, T is the absolute temperature and K is the thermal conductivity. ZT can be increased by both increasing S and. sigma or decreasing K. In this study we have prepared a thermoelectric generator from 100 alternating layers of SiO2/SiO2+Au superlattice films using ion beam assisted deposition (IBAD). In order to determine the stoichiometry of SiO2 and Au in the grown multilayer films, Rutherford Backscattering Spectrometry (RBS) was used. The 5 MeV Si ions bombardment was performed using the CIM Pelletron ion beam accelerator to make nanodots and/or nanoclusters in the multi-layer superlattice thin films to decrease the cross plane thermal conductivity, increase the cross plane Seebeck coefficient and increase the cross plane electrical conductivity.
引用
收藏
页码:257 / 259
页数:3
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