Resonant soft X-ray emission for studies of molecules and solids

被引：17
|
作者：
Nordgren, Joseph [1 ]
Rubensson, Jan-Erik [1 ]
机构：
[1] Uppsala Univ, Dept Phys & Astron, SE-75120 Uppsala, Sweden
来源：
JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA | 2013年 / 188卷
关键词：
Soft X-ray emission; Synchrotron radiation; RIXS; X-ray Raman spectroscopy; SYMMETRY-BREAKING; VIBRATIONAL STRUCTURE; ELECTRONIC-STRUCTURE; SCATTERING SPECTRA; SPECTROSCOPY; EXCITATIONS; SPECTROMETER; INFORMATION; DICHROISM; DYNAMICS;
D O I：
10.1016/j.elspec.2012.11.004
中图分类号：
O433 [光谱学];
学科分类号：
0703 ; 070302 ;
摘要：
Resonant inelastic X-ray scattering (RIXS) has emerged as a powerful method for the study of the electronic structure of matter in various phases and ambient conditions. The selectivity offered by resonant excitation and polarization control in RIXS experiments offers rich information on excitations in molecules, liquids, and solids. The photon-in photon-out nature of RIXS makes it an interesting method in the study of ultra-high brightness FEL radiation interaction with matter. The present work offers an introductory review on the sub-key RIXS, including some historic comments. (C) 2012 Elsevier B.V. All rights reserved.
引用
收藏
页码：3 / 9
页数：7
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