RAIDR: Retention-Aware Intelligent DRAM Refresh

被引:0
|
作者
Liu, Jamie [1 ]
Jaiyen, Ben [1 ]
Veras, Richard [1 ]
Mutlu, Onur [1 ]
机构
[1] Carnegie Mellon Univ, Pittsburgh, PA 15213 USA
基金
美国国家科学基金会;
关键词
D O I
暂无
中图分类号
TP3 [计算技术、计算机技术];
学科分类号
0812 ;
摘要
Dynamic random-access memory (DRAM) is the building block of modern main memory systems. DRAM cells must be periodically refreshed to prevent loss of data. These refresh operations waste energy and degrade system performance by interfering with memory accesses. The negative effects of DRAM refresh increase as DRAM device capacity increases. Existing DRAM devices refresh all cells at a rate determined by the leakiest cell in the device. However, most DRAM cells can retain data for significantly longer. Therefore, many of these refreshes are unnecessary. In this paper, we propose RAIDR (Retention-Aware Intelligent DRAM Refresh), a low-cost mechanism that can identify and skip unnecessary refreshes using knowledge of cell retention times. Our key idea is to group DRAM rows into retention time bins and apply a different refresh rate to each bin. As a result, rows containing leaky cells are refreshed as frequently as normal, while most rows are refreshed less frequently. RAIDR uses Bloom filters to efficiently implement retention time bins. RAIDR requires no modification to DRAM and minimal modification to the memory controller. In an 8-core system with 32 GB DRAM, RAIDR achieves a 74.6% refresh reduction, an average DRAM power reduction of 16.1%, and an average system performance improvement of 8.6% over existing systems, at a modest storage overhead of 1.25 KB in the memory controller. RAIDR's benefits are robust to variation in DRAM system configuration, and increase as memory capacity increases.
引用
收藏
页码:1 / 12
页数:12
相关论文
共 50 条
  • [1] Integration Scheme for Retention-aware DRAM Refresh
    Cheng, Wei-Kai
    Li, Xin-Lun
    Chen, Jian-Kai
    2017 INTERNATIONAL CONFERENCE ON ELECTRON DEVICES AND SOLID-STATE CIRCUITS (EDSSC), 2017,
  • [2] Integration of Retention-aware Refresh and BISR Techniques for DRAM Refresh Power Reduction
    Cheng, Wei-Kai
    Chen, Jian-Kai
    Huang, Shih-Hsu
    2018 INTERNATIONAL SOC DESIGN CONFERENCE (ISOCC), 2018, : 50 - 51
  • [3] Retention-Aware Refresh Techniques for Reducing Power and Mitigation of Data Retention Faults in DRAM
    Shyue-Kung Lu
    Hung-Kai Huang
    Chun-Lung Hsu
    Chi-Tien Sun
    Kohei Miyase
    Journal of Electronic Testing, 2019, 35 : 485 - 495
  • [4] Retention-Aware DRAM Auto-Refresh Scheme for Energy and Performance Efficiency
    Cheng, Wei-Kai
    Shen, Po-Yuan
    Li, Xin-Lun
    MICROMACHINES, 2019, 10 (09)
  • [5] Retention-Aware Refresh Techniques for Reducing Power and Mitigation of Data Retention Faults in DRAM
    Lu, Shyue-Kung
    Huang, Hung-Kai
    Hsu, Chun-Lung
    Sun, Chi-Tien
    Miyase, Kohei
    JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS, 2019, 35 (04): : 485 - 495
  • [6] CAM-based retention-aware DRAM (CRA-DRAM) for refresh power reduction
    Ye, Yong
    Du, Yuan
    Jing, Weiliang
    Li, Xiaoyun
    Song, Zhitang
    Chen, Bomy
    IEICE ELECTRONICS EXPRESS, 2017, 14 (10):
  • [7] CAM-based retention-aware DRAM (CRA-DRAM) for refresh power reduction (vol 14, 20170053, 2017)
    Jing, W.
    IEICE ELECTRONICS EXPRESS, 2017, 14 (11):
  • [8] Retention-Aware DRAM Assembly and Repair for Future FGR Memories
    Wang, Ying
    Han, Yin-He
    Wang, Cheng
    Li, Huawei
    Li, Xiaowei
    IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS, 2017, 36 (05) : 705 - 718
  • [9] Retention-aware placement in DRAM (RAPID): Software methods for quasi-non-volatile DRAM
    Venkatesan, Ravi K.
    Herr, Stephen
    Rotenberg, Eric
    TWELFTH INTERNATIONAL SYMPOSIUM ON HIGH-PERFORMANCE COMPUTER ARCHITECTURE, PROCEEDINGS, 2006, : 157 - +
  • [10] Retention-Aware Hybrid Main Memory (RAHMM): Big DRAM and Little SCM
    Jing, Weiliang
    Yang, Kai
    Lin, Yinyin
    Lee, Beomseop
    Yoon, Sangkyu
    Ye, Yong
    Du, Yuan
    Chen, Bomy
    IEEE TRANSACTIONS ON COMPUTERS, 2017, 66 (05) : 912 - 918