Substrate dependent structural and electrical properties of Bi2Cu0.1V0.9O5.35 solid electrolyte thin films

被引:10
|
作者
Nimat, R. K. [2 ]
Joshi, R. S. [1 ]
Pawar, S. H. [1 ]
机构
[1] Shivaji Univ, Dept Phys, Sch Energy Studies, Kolhapur 416004, MS, India
[2] Balasaheb Desai Coll, Dept Phys, Satara 415206, MS, India
关键词
Chemical synthesis; X-ray diffraction; Ionic conduction; Electronic transport; Grain boundaries; Thin films;
D O I
10.1016/j.jallcom.2007.11.051
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
High ion conducting room temperature stabilized gamma-Bi2Cu0.1V0.9O5.35 has been successfully synthesized in thin film form on glass and alumina substrates. The films were characterized for their structural properties like XRD, SEM, EDAX and AFM. Bi2Cu0.1V0.9O5.35 films deposited on alumina substrate showed single-phase nature with tetragonal crystal structure. The AFM study reveals the considerable change in growth morphology on alumina substrate. The temperature dependent ionic conductivity of Bi2Cu0.1V0.9O5.35 films synthesized on glass and alumina substrates were studied using impedance spectroscopy. The high ionic conductivity has been observed at lower temperature for Bi2Cu0.1V0.9O5.35 thin films synthesized on alumina substrates. With these comparisons, alumina substrate proves its candidature for deposition of Bi2Cu0.1V0.9O5.35 films for solid oxide fuel cell applications. (C) 2007 Elsevier B.V. All rights reserved.
引用
收藏
页码:341 / 351
页数:11
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