Diameter dependence of 1/f noise in carbon nanotube field effect transistors using noise spectroscopy

被引:11
|
作者
Kawahara, Toshio [1 ]
Yamaguchi, Satarou [1 ]
Ohno, Yasuhide [2 ]
Maehashi, Kenzo [2 ]
Matsumoto, Kazuhiko [2 ]
Mizutani, Shin [3 ]
Itaka, Kenji [4 ]
机构
[1] Chubu Univ, Ctr Appl Superconduct & Sustainable Energy Res, Kasugai, Aichi 4878501, Japan
[2] Osaka Univ, Inst Sci & Ind Res, Osaka 5670047, Japan
[3] NTT Commun Sci Labs, Seika, Kyoto 6190237, Japan
[4] Hirosaki Univ, N Japan Res Inst Sustainable Energy, Aomori 0300813, Japan
关键词
Carbon nano tube; Field effect transistors; 1/f noise; STOCHASTIC RESONANCE;
D O I
10.1016/j.apsusc.2012.08.003
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
Carbon nanotubes (CNTs) have many interesting properties for nano devices such as high sensitive sensors or noise enhanced nonlinear devices. A field effect transistor (FET) structure is one of the key features for these applications, and the control of noise in FETs is important for the actual operation of the application. Several origins of noise have been proposed, and defects and/or surface adsorption of molecules seem to be dominant for the 1/f type noise in CNTs. To study the origins of noise, the diameter dependence of noise properties was studied. We analyzed the noise properties in CNTs using noise spectroscopy with different fabrication parameters or ambient environments. We observed the crossover of noise properties in CNTs, which involved transition between different origins of noise depending on their diameter. Additionally, noise spectroscopy was used to observe such crossover between air and vacuum environments. We can control noise intensity using the gate voltage, and noise properties can be controlled by the fabrication parameters. These phenomena are useful for the stochastic operation of CNT-FETs. (C) 2012 Elsevier B. V. All rights reserved.
引用
收藏
页码:101 / 105
页数:5
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