Resonant scattering of polarized soft X-rays for the study of magnetic oxide layers

被引：6
|
作者：
Sacchi, M
Hague, CF
Gota, S
Guiot, E
Gautier-Soyer, M
Pasquali, L
Mrowka, S
Gullikson, EM
Underwood, JH
机构：
[1] CEA Saclay, DRECAM, SRSIM, F-91191 Gif Sur Yvette, France
[2] Lab Chim Phys Mat & Rayonnement, F-75231 Paris, France
[3] Ctr Univ Paris Sud, LURE, F-91405 Orsay, France
[4] Ist Nazl Fis Mat, Sez Modena, I-41100 Modena, Italy
[5] Univ Calif Berkeley, Lawrence Berkeley Lab, Div Mat Sci, Ctr Xray Opt, Berkeley, CA 94720 USA
来源：
JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA | 1999年 / 101卷
关键词：
oxide layers; polarized soft X-rays; resonant scattering;
D O I：
10.1016/S0368-2048(98)00500-3
中图分类号：
O433 [光谱学];
学科分类号：
0703 ; 070302 ;
摘要：
We report preliminary results that illustrate the potential of resonant scattering of polarized soft X-rays applied to the study of the magnetic properties of oxide layers. As a test case, we study iron oxides, a class of materials of high technological interest, especially when prepared in the form of thin epitaxial layers. (C) 1999 Elsevier Science B.V. All rights reserved.
引用
收藏
页码：407 / 412
页数：6
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