Hybrid photodiode crosstalk due to backscattered electrons

被引：0
|
作者：
Freeman, J [1 ]
Green, D [1 ]
Ronzhin, A [1 ]
机构：
[1] Fermilab Natl Accelerator Lab, Batavia, IL 60510 USA
来源：
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT | 2001年 / 474卷 / 02期
关键词：
hybrid; photodiode; crosstalk; backscattered electrons;
D O I：
10.1016/S0168-9002(01)00874-9
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
The fraction of backscattering electrons are measured for 19 and 73 pixel Hybrid Photodiodes. The data obtained are in good agreement with calculations. A new method of HPD alignment is proposed and tested. (C) 2001 Elsevier Science B.V. All rights reserved.
引用
收藏
页码：143 / 150
页数：8
相关论文
共 50 条
  • [1] Crosstalk properties of the CMS HCAL hybrid photodiode
    Cushman, P
    Heering, AH
    Pearson, N
    Elias, J
    Freeman, J
    Green, D
    Los, S
    Ronzhin, A
    NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, 2003, 504 (1-3): : 62 - 69
  • [2] SECONDARY-ELECTRON EMISSION DUE TO PRIMARY AND BACKSCATTERED ELECTRONS
    KANAYA, K
    KAWAKATSU, H
    JOURNAL OF PHYSICS D-APPLIED PHYSICS, 1972, 5 (09) : 1727 - +
  • [3] BACKSCATTERED ELECTRONS
    DAGUET, C
    JOURNAL DE MICROSCOPIE, 1972, 14 (03): : 241 - +
  • [4] BACKSCATTERED ELECTRONS IN THE SEM - THE CONTRAST DUE TO THE CHANGE OF THE TARGET MATERIAL DENSITY
    CALSTYAN, VG
    AKCHURIN, MS
    IZVESTIYA AKADEMII NAUK SERIYA FIZICHESKAYA, 1993, 57 (08): : 59 - 61
  • [5] DOSE ENHANCEMENT DUE TO BACKSCATTERED SECONDARY ELECTRONS AT INTERFACE OF 2 MEDIA
    MURTHY, MSS
    LAKSHMANAN, AR
    RADIATION RESEARCH, 1976, 67 (02) : 215 - 223
  • [6] AUGER AND SECONDARY ELECTRONS EXCITED BY BACKSCATTERED ELECTRONS
    GOTO, K
    KOSHIKAWA, T
    SHIMIZU, R
    ISHIKAWA, K
    JAPANESE JOURNAL OF APPLIED PHYSICS, 1974, : 633 - 635
  • [7] AUGER AND SECONDARY ELECTRONS EXCITED BY BACKSCATTERED ELECTRONS
    GOTO, K
    ISHIKAWA, K
    KOSHIKAWA, T
    SHIMIZU, R
    APPLIED PHYSICS LETTERS, 1974, 24 (08) : 358 - 359
  • [8] Characterising Backscattered Electrons in EBCMOS
    Wang, Xuening
    Song, De
    Jiao, Gangcheng
    Li, Ye
    Chen, Weijun
    IEEE PHOTONICS JOURNAL, 2022, 14 (06):
  • [9] MICRODENSITOMETRY USING BACKSCATTERED ELECTRONS
    DECKMAN, HW
    BLACK, D
    JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1979, 69 (10) : 1434 - 1434
  • [10] IMAGING PROCESSING OF BACKSCATTERED ELECTRONS
    VICARIO, E
    JOURNAL DE MICROSCOPIE ET DE SPECTROSCOPIE ELECTRONIQUES, 1982, 7 (01): : 91 - 96
12345