Structure and stability of xenon insertion compounds of hypohalous acids, HXeOX [X=F, Cl, and Br]:: An ab initio investigation

被引:41
|
作者
Jayasekharan, T
Ghanty, TK [1 ]
机构
[1] Bhabha Atom Res Ctr, Theoret Chem Sect, Chem Grp, Bombay 400085, Maharashtra, India
[2] Bhabha Atom Res Ctr, Div Spect, Phys Grp, Bombay 400085, Maharashtra, India
来源
JOURNAL OF CHEMICAL PHYSICS | 2006年 / 124卷 / 16期
关键词
D O I
10.1063/1.2193515
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
The structure and stability of xenon-inserted hypohalous acids HXeOX (X=F, Cl, and Br) have been investigated theoretically using ab initio molecular orbital calculations. All these molecules are found to consist of a nearly linear HXeO moiety and a bend XeOX fragment. Geometrical parameters of HXeOX are comparable with that of experimentally observed HXeOH species. The dissociation energies corresponding to the lowest-energy fragmentation products, HOX+Xe have been computed to be -398.1, -385.5, and -386.7 kJ/mol for HXeOF, HXeOCl, and HXeOBr, respectively, at the MP2 level of theory. The respective barrier heights corresponding to the bent transition states (H-Xe-O bending mode) have been calculated to be 138.1, 138.4, and 138.2 kJ/mol with respect to HXeOX minimum. These species are found to be metastable in their respective potential-energy surface, and the dissociation energies corresponding to the H+Xe+OX products are found to be 56.8, 66.0, and 80.8 kJ/mol for HXeOF, HXeOCl, and HXeOBr, respectively. The energies corresponding to the H+Xe+O+X dissociation channel have been computed to be 272.0, 309.3, and 299.7 kJ/mol for HXeOF, HXeOCl, and HXeOBr, respectively, at the same level of theory. Energetics as well as geometrical considerations suggests that it may be possible to prepare these species experimentally similar to that of HXeOH species at low-temperature laser photolysis experiments. (c) 2006 American Institute of Physics.
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页数:6
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