Ion Track Structure and Dynamics in SiO2

被引：16
|
作者：
Murat, M. [1 ]
Akkerman, A. [1 ]
Barak, J. [1 ]
机构：
[1] Soreq NRC, IL-81800 Yavne, Israel
来源：
IEEE TRANSACTIONS ON NUCLEAR SCIENCE | 2008年 / 55卷 / 04期
关键词：
Charge radial distribution; microdose and straggling effects; Monte Carlo simulation; time evolution of track structure;
D O I：
10.1109/TNS.2008.921937
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
Differential spatiotemporal distributions of the deposited energy around ion tracks in SiO2 are calculated using Monte Carlo simulations with input parameters extracted from the complex dielectric function theory. It is shown that the spatial and temporal dependences cannot be separated. The track evolution and the time to reach a given energy deposition are approximately calculated. The track radius is evaluated from the radial distribution of the deposited energy as a function of ion energy. Formation of a visible track due to lattice damage through ionization (latent track), as well as straggling in energy deposition are discussed.
引用
收藏
页码：2113 / 2120
页数：8
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