Optical measurements of the probability of atom de-excitation on the surface of transparent windows in ultrashort cells

被引：1

作者：

Przhibelskii, S. G. ^{[1
]}

机构：

[1] Natl Res Univ Informat Technol Mech & Opt, St Petersburg 199034, Russia

来源：

OPTICS AND SPECTROSCOPY | 2012年 / 112卷 / 05期

基金：

俄罗斯基础研究基金会;

关键词：

Luminescence Intensity; Excited Atom; Atomic Excitation; Atomic Transition Frequency; Transparent Dielectric;

D O I：

10.1134/S0030400X12050141

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

A method for measuring the probability of excitation quenching of atoms on the surface of transparent dielectrics using data on the dependence of the luminescence intensity of atom in an ultrashort cell on the distance between its windows is suggested. Two possibilities of performing the measurements based on the luminescence recording are considered: from the volume at the atomic transition frequency and from the near-wall region in the range of distant wings of atomic lines.

引用

页码：649 / 651

页数：3

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