Susceptibility of flash ADCs to electromagnetic interference

被引：2
|
作者：
Kennedy, Simon [1 ]
Yuce, Mehmet Rasit [1 ]
Redoute, Jean-Michel [1 ]
机构：
[1] Monash Univ, Dept Elect & Comp Syst Engn, Melbourne, Vic, Australia
来源：
MICROELECTRONICS RELIABILITY | 2018年 / 81卷
关键词：
Device reliability; Immunity; IEC; 62132; DPI method; ADC immunity measurement; SUBSTRATE NOISE;
D O I：
10.1016/j.microrel.2017.12.040
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
Integrated devices acquiring environmental, industrial or biomedical signals are ubiquitous and require sensor systems to be situated in electromagnetically hostile environments and continue to operate reliably. The susceptibility to injected electromagnetic interference by an 8-bit flash Analog to Digital Converter (ADC) was measured using the direct power injection method (IEC 62132-4). The analysis of the immunity results and the susceptibility of the internal structure of the device are presented. Measurements show that the supply port is immune to interference but the analog input and reference voltage input ports are quite susceptible. Better understanding of the susceptibility of a flash ADC to EMI enables designers to reduce the cost of preventative measures implemented at the system level and improve the reliability of sensor systems.
引用
收藏
页码：218 / 225
页数：8
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