Key International Comparison of AC-DC Current Transfer Standards CCEM-K12 Final Report

被引:2
|
作者
Budovsky, Ilya [1 ]
机构
[1] Natl Measurement Inst, Lindfield, NSW 2070, Australia
关键词
D O I
10.1088/0026-1394/49/1A/01012
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
引用
收藏
页数:67
相关论文
共 50 条
  • [1] APMP Key Comparison of ac-dc Current Transfer Standards Final Report
    Jing T.
    Metrologia, 2024, 1 A
  • [2] International comparison of AC-DC current transfer standards
    Heine, G.
    Garcocz, M.
    Waldmann, W.
    METROLOGIA, 2017, 54
  • [3] Final report on APMP international comparison APMP.EM-K9: High voltage AC-DC transfer standards
    Wei, Yih-Cheng
    Yeh, Hsin-Da
    METROLOGIA, 2010, 47
  • [4] AN INTERNATIONAL COMPARISON OF THERMAL CONVERTERS AS AC-DC TRANSFER STANDARDS
    GALAKHOVA, OP
    HARKNESS, S
    HERMACH, FL
    HIRAYAMA, H
    MARTIN, P
    ROZDESTVENSKAYA, TH
    WILLIAMS, ES
    IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 1980, 29 (04) : 396 - 399
  • [5] International comparison on ac-dc current transfer standards at frequencies up to 1 MHz
    Budovsky, I.
    Funck, T.
    Garcocz, M.
    Heine, G.
    Rydler, K. -E.
    Tarasso, V.
    2008 CONFERENCE ON PRECISION ELECTROMAGNETIC MEASUREMENTS DIGEST, 2008, : 24 - +
  • [6] Final report on APMP.EM-K6.a: APMP international comparison of ac-dc transfer standards at the lowest attainable level of uncertainty
    Budovsky, Ilya
    METROLOGIA, 2010, 47
  • [7] Final report on key comparison CCEM-K8 (dc voltage ratio)
    Reedtz, G. Marullo
    Cerri, R.
    METROLOGIA, 2003, 40
  • [8] Final report of key comparison EURAMET.EM-K11 ac-dc voltage transfer difference at low voltages
    Rydler, Karl-Erik
    Tarasso, Valter
    METROLOGIA, 2011, 48
  • [9] Coaxial shunts for the ac-dc transfer standards of current
    Pogliano, U.
    Bosco, G. C.
    Serazio, D.
    2008 CONFERENCE ON PRECISION ELECTROMAGNETIC MEASUREMENTS DIGEST, 2008, : 30 - 31
  • [10] Coaxial Shunts as AC-DC Transfer Standards of Current
    Pogliano, Umberto
    Bosco, Gian Carlo
    Serazio, Danilo
    IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 2009, 58 (04) : 872 - 877