Characterizing the Impact of Conductor Surface Roughness on CB-CPW Behavior via Reduced Computational Complexity

被引：0

作者：

Sain, Arghya ^{[1
]}

Melde, Kathleen L. ^{[1
]}

机构：

[1] Univ Arizona, Dept Elect & Comp Engn, Tucson, AZ 85721 USA

来源：

2012 IEEE 21ST CONFERENCE ON ELECTRICAL PERFORMANCE OF ELECTRONIC PACKAGING AND SYSTEMS | 2012年

关键词：

autocorrelation function (ACF); conductor backed coplanar waveguide (CB-CPW); conductor loss; interconnect; root mean square height (Hrms); surface roughness; transmission lines; METHODOLOGY;

D O I：

暂无

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

This paper presents a way to include the effects of conductor surface roughness in three-dimensional full wave simulation tools. A comparison of the computational load and attenuation coefficient as a function of the number and area of different surfaces roughened is given.

引用

页码：260 / 263

页数：4