Dopant incorporation and defects in III-V nitrides and related semiconductors and their applications

被引:0
|
作者
Morkoc, H [1 ]
机构
[1] USAF, WRIGHT LAB, WRIGHT PATTERSON AFB, OH 45433 USA
关键词
D O I
暂无
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
Gallium Nitride and its alloys with InN and AIN have recently emerged as important semiconductor materials with applications to yellow, green, blue and ultraviolet portions of the spectrum as emitters and detectors, and high power electronic devices. Nitride LEDs exhibit brightness levels and longevity well in access of what is required for outdoor applications. Combined with the available Very LEDs, one can; for the first time, have full color all semiconductor displays. Very recently pulsed room temperature operation of 410 nm semiconductor laser, the shortest wavelength ever from a semiconductor, has been reported. If used for traffic lights, in office. automobile, aircraft, airport, run-ways, ships and home illumination, these devices can outlast and outperform the incandescent light bulbs while saving precious energy. This material system is also intrinsically germane to short wavelength semiconductor lasers for increased data storage. Nitrides are also conductive for high power devices/circuits, and sensors and detectors with applications in high temperature and unfriendly environments. Estimates show that substantial weight savings can be had in aircraft and spacecraft. In aircraft, the devices can replace the bulky hydraulics rendering the craft more reliable and lighter while avoiding costly coolers. Moreover, AlGaN alloy with bandgaps above 5.5 eV shows negative electron affinity surface with applications to cold cathodes in general and flat panel displays in particular. GaN and related materials are rich in defects? certainly to a large extent due to the lack of native substrates, whose characteristics have been analyzed both structurally and electronically. Recent data indicate that the large background electron concentrations encountered in early stages of development are due to nitrogen vacancies. The p type doping incorporation is a very complex process in that the presence of p type impurities in the growth environment can result in defect formation. However, when the conditions are favorable, the p type dopant incorporation follows the side selection criteria meaning conditions favoring Ga vacancies appear to be desirable.
引用
收藏
页码:S26 / S51
页数:26
相关论文
共 50 条
  • [1] Defects in and applications of III-V nitride semiconductors
    Morkoc, H
    PROCEEDINGS OF THE 13TH INTERNATIONAL CONFERENCE ON DEFECTS IN INSULATING MATERIALS - ICDIM 96, 1997, 239-2 : 119 - 143
  • [2] Defects and doping in III-V nitrides
    Van de Walle, CG
    Neugebauer, J
    DEFECTS IN SEMICONDUCTORS - ICDS-19, PTS 1-3, 1997, 258-2 : 19 - 26
  • [3] Defects, doping and interfaces in III-V nitrides
    Van de Walle, CG
    PHYSICS AND SIMULATION OF OPTOELECTRONIC DEVICES VI, PTS 1 AND 2, 1998, 3283 : 52 - 59
  • [4] Theory of doping and defects in III-V nitrides
    Van de Walle, Chris G.
    Stampfl, Catherine
    Neugebauer, Joerg
    Journal of Crystal Growth, 189-190 : 505 - 510
  • [5] Theory of doping and defects in III-V nitrides
    Van de Walle, CG
    Stampfl, C
    Neugebauer, J
    JOURNAL OF CRYSTAL GROWTH, 1998, 189 : 505 - 510
  • [6] LOCALIZED DEFECTS IN III-V SEMICONDUCTORS
    JAROS, M
    BRAND, S
    PHYSICAL REVIEW B, 1976, 14 (10): : 4494 - 4505
  • [7] DEFECTS IN III-V COMPOUND SEMICONDUCTORS
    PETROFF, PM
    SEMICONDUCTORS AND SEMIMETALS, 1985, 22 : 379 - 403
  • [8] The incorporation of hydrogen into III-V nitrides during processing
    Pearton, SJ
    Shul, RJ
    Wilson, RG
    Ren, F
    Zavada, JM
    Abernathy, CR
    Vartuli, CB
    Lee, JW
    Mileham, JR
    Mackenzie, JD
    JOURNAL OF ELECTRONIC MATERIALS, 1996, 25 (05) : 845 - 849
  • [9] Silicon impurity-related effects on structural defects in III-V nitrides
    Shmidt, N
    Busov, V
    Emtsev, VV
    Kyutt, R
    Lundin, W
    Poloskin, DS
    Ratnikov, V
    Sakharov, A
    Usikov, A
    SOLID STATE PHENOMENA, 1999, 70 : 525 - 529
  • [10] III-V nitrides for electronic and UV applications
    Henini, Mohamed
    III-Vs Review, 12 (05): : 28 - 32