A new approximation of Mossbauer integrals is presented. Commonly used thin absorber (scatterer) approximation neglects nonlinear contribution to amplitude thickness dependence, so it also neglects the influence of thickness on relative intensities of Mossbauer lines. This causes systematic errors when relation between occupations of sublattices, known from crystallographic investigations, is used. The presented approximation, based on the Taylor series of exponent function at different from zero point, describes thickness dependences quite well. In contrast to Mossbauer integrals, the method hardly affects the computer calculation time.