Multiple reflection method for electromagnetic waves in layered dielectric structures

被引：8
|
作者：
Morozov, GV [1 ]
Maev, RG [1 ]
Drake, GWF [1 ]
机构：
[1] Univ Windsor, Dept Phys, Windsor, ON N9B 3P4, Canada
来源：
QUANTUM ELECTRONICS | 2001年 / 31卷 / 09期
关键词：
layered dielectric structure; electromagnetic wave; oblique incidence; reflection coefficient;
D O I：
10.1070/QE2001v031n09ABEH002042
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
Reflection and transmission of a plane electromagnetic wave propagating in a layered dielectric structure with an arbitrary number of layers of various thicknesses are investigated. For the general case of oblique incidence of the wave on this structure, the reflection and transmission coefficients are calculated for both TE and TM waves using a multiple reflection method. An algorithm to apply the obtained formulas for numerical and analytical calculations is suggested.
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页码：767 / 773
页数：7
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