Coupled simulation of gas flow and heat transfer in an RTP-system with rotating wafer

被引:0
|
作者
Poscher, S [1 ]
Theiler, T [1 ]
机构
[1] Fraunhofer Inst Integrierte Schaltungen, Bereich Bauelementetechnol, D-91058 Erlangen, Germany
来源
RAPID THERMAL PROCESSING | 1999年 / 84卷
关键词
D O I
暂无
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
In this study the concept of a lamp heated RTP-system with rotating wafer is considered. Using the fluid-flow-simulation software Phoenics-CVD, we investigated the cooling of the wafer by a process gas flow which is injected at room temperature into the hot process chamber through an inlet pipe in the side wall. In a full 3D-simulation of the gas flow and of the heat transfer in the gas and in the wafer the Navier-Stokes equations and the energy equation are solved. The radiative power consumption and the energy loss of the wafer have been modeled by the Stefan-Boltzmann law. Simulations without wafer rotation show a strong drop in the temperature distribution at the wafer near the inlet pipe. In contrast to this, simulations with rotation show an axisymmetric temperature distribution with a considerably smaller temperature gradient over the wafer. Comparisons with oxidation experiments showed good agreement with the simulation results. (C) 1999 Elsevier Science Ltd. All rights reserved.
引用
收藏
页码:201 / 205
页数:5
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