Current-Voltage Characteristics CNTFET Considering Non-Ballistic Conduction: Effect of Gate Oxide Thickness

被引:0
|
作者
Rouf, Nirjhor Tahmidur [1 ]
Deep, Ashfaqul Haq [1 ]
Hassan, Rusafa Binte [1 ]
Khan, Sabbir Ahmed [2 ]
Hasan, Mahmudul [1 ]
Mominuzzaman, Sharif Mohammad [3 ]
机构
[1] BRAC Univ, Dept Elect & Elect Engn, Dhaka, Bangladesh
[2] BRAC Univ, Control & Applicat Res Ctr, Dhaka, Bangladesh
[3] Bangladesh Univ Engn & Technol, Dept Elect & Elect Engn, Dhaka 1000, Bangladesh
关键词
carbon nanotube field effect transistor; gate oxide thickness; ballistic effect; non-ballistic effect; current-voltage characteristics; TRANSISTORS INCLUDING NONIDEALITIES; COMPACT SPICE MODEL;
D O I
暂无
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Carbon nanotube is being considered as a prospective alternative for the existing Silicon technology in present days. The advancement of Silicon technology, at present, has slowed down considerably because of its various material issues and scaling limitations and so, carbon nanotubes have gained the attention of researchers around the world over. In this literature, the effect of gate oxide thickness on the performance of carbon nanotube field effect transistor (CNTFET) with nonballistic conduction is extensively investigated. It is found in this study that with the increase of the gate oxide thickness, the current output of CNTFET considering non-ballistic conduction deteriorates by a significant amount. In addition to this, the results obtained from this experiment are compared with previously reported CNTFET with ballistic conduction data for a better perception of the non-ballistic conduction effects. Also, the on and off state current ratios have been calculated and plotted in this work to further contrast the ballistic and non-ballistic conduction of CNTFET.
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页数:4
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