A new approach to measuring technology with an application to the shape of the diffusion curves

被引：22

作者：

Comin, Diego ^{[1
,2
]}

Hobijn, Bart ^{[3
]}

Rovito, Emilie ^{[3
]}

机构：

[1] Harvard Univ, Cambridge, MA 02138 USA

[2] NBER, Cambridge, MA 02138 USA

[3] Fed Reserve Bank New York, New York, NY 10045 USA

来源：

JOURNAL OF TECHNOLOGY TRANSFER | 2008年 / 33卷 / 02期

基金：

美国国家科学基金会;

关键词：

technology adoption; cross-country studies;

D O I：

10.1007/s10961-007-9079-2

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

This paper documents the sources and measures of the cross-country historical adoption technology (CHAT) data set that covers the diffusion of about 115 technologies in over 150 countries over the last 200 years. We use this comprehensive data set to explore the shape of the diffusion curves. Our main finding is that, once the intensive margin is measured, technologies do not diffuse in a logistic way.

引用

页码：187 / 207

页数：21

共 23 条

[1] A MODEL OF GROWTH THROUGH CREATIVE DESTRUCTION [J].