Rapid low dose electron tomography using a direct electron detection camera

被引：54
|
作者：
Migunov, Vadim [1 ,2 ]
Ryll, Henning [3 ]
Zhuge, Xiaodong [4 ]
Simson, Martin [5 ]
Strueder, Lothar [3 ,6 ]
Batenburg, K. Joost [4 ,7 ,8 ]
Houben, Lothar [1 ,2 ]
Dunin-Borkowski, Rafal E. [1 ,2 ]
机构：
[1] Forschungszentrum Julich, Ernst Ruska Ctr Microscopy & Spect Elect, D-52425 Julich, Germany
[2] Forschungszentrum Julich, Peter Grunberg Inst, D-52425 Julich, Germany
[3] PNSensor GmbH, D-81739 Munich, Germany
[4] Ctr Wiskunde & Informat, NL-1090 GB Amsterdam, Netherlands
[5] PNDetector GmbH, D-81739 Munich, Germany
[6] Univ Siegen, D-57068 Siegen, Germany
[7] Leiden Univ, Math Inst, NL-2300 RA Leiden, Netherlands
[8] Univ Antwerp, iMinds Vis Lab, Antwerp, Belgium
来源：
SCIENTIFIC REPORTS | 2015年 / 5卷
关键词：
MICROTOMOGRAPHY;
D O I：
10.1038/srep14516
中图分类号：
O [数理科学和化学]; P [天文学、地球科学]; Q [生物科学]; N [自然科学总论];
学科分类号：
07 ; 0710 ; 09 ;
摘要：
We demonstrate the ability to record a tomographic tilt series containing 3487 images in only 3.5 s by using a direct electron detector in a transmission electron microscope. The electron dose is lower by at least one order of magnitude when compared with that used to record a conventional tilt series of fewer than 100 images in 15-60 minutes and the overall signal-to-noise ratio is greater than 4. Our results, which are illustrated for an inorganic nanotube, are important for ultra-low-dose electron tomography of electron-beam-sensitive specimens and real-time dynamic electron tomography of nanoscale objects with sub-ms temporal resolution.
引用
收藏
页数：5
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