Infrared detectors and test technology of cryogenic camera

被引:0
|
作者
Yang Xiaole [1 ]
Liu Xingxin [2 ]
Xing Mailing [1 ]
Ling Long [1 ]
机构
[1] Beijing Inst Space Mech & Elect, Beijing, Peoples R China
[2] North China Res Inst Electroopt, Beijing, Peoples R China
来源
INFRARED TECHNOLOGY AND APPLICATIONS, AND ROBOT SENSING AND ADVANCED CONTROL | 2016年 / 10157卷
关键词
Cryogenic camera; Cryogenic background; Infrared detector; Detector test;
D O I
10.1117/12.2246503
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Cryogenic camera which is widely used in deep space detection cools down optical system and support structure by cryogenic refrigeration technology, thereby improving the sensitivity. Discussing the characteristics and design points of infrared detector combined with camera's characteristics. At the same time, cryogenic background test systems of chip and detector assembly are established. Chip test system is based on variable cryogenic and multilayer Dewar, and assembly test system is based on target and background simulator in the thermal vacuum environment. The core of test is to establish cryogenic background. Non-uniformity, ratio of dead pixels and noise of test result are given finally. The establishment of test system supports for the design and calculation of infrared systems.
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页数:8
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