Nondestructive inspection of organic films on sandblasted metals using diffuse reflectance infrared spectroscopy

Diffuse reflectance infrared spectroscopy is a very useful tool for the determination of surface contamination and characterization of films in manufacturing applications. Spectral data from the surfaces of a host of practical materials may be obtained with sufficient insensitivity to characterize relatively thick films, such as paint, and the potential exists to detect very thin films, such as trace oil contamination on metals. The SOC 400 Surface Inspection Machine/InfraRed (SIMIR) has been developed as a nondestructive inspection tool to exploit this potential in practical situations. This SIIR is a complete and ruggidized Fourier transform infrared spectrometer with a very efficient and robust barrel ellipse diffuse reflectance optical collection system and operating software system. The SIMIR weighs less than 8 Kg, occupies less than 14 L volume, and may be manipulated into any orientation during operation. The surface to be inspected is placed at the focal point of the SIM/IR by manipulating the SIMIR or the surface. The SIMIR may or may not contact the surface being inspected. For flat or convex items, there are no size limits to items being inspected. For concave surfaces, the SIMIR geometry limits the surface to those having a radius of curvature greater than 0.2 m. For highly reflective metal surfaces, the SIMIR has a noise level approaching 1 x 10(-4) absorbance units, which is sufficient for detecting nanometer thick organic film residues on metals. The use of this nondestructive inspection tool is demonstrated by the spatial mapping of organic stains on sand blasted metals in which organic stains such as silicone oils, mineral oils, and triglycerides are identified both qualitatively and quantitatively over the surface of the metal specimen.