Nonparametric algorithm of electronic components test data pattern recognition

被引：0
|
作者：
Koplyarova, N. V. [1 ]
Chzhan, E. A. [1 ]
Medvedev, A. V. [1 ]
Korneeva, A. A. [1 ]
Raskina, A. V. [1 ]
Kukartsev, V. V. [1 ,2 ]
Tynchenko, V. S. [1 ,2 ]
机构：
[1] Siberian Fed Univ, Svobodny Pr 79, Krasnoyarsk 660041, Russia
[2] Siberian State Univ Sci & Technol, Krasnoyarskiy Rabochiy Ave 31, Krasnoyarsk 660037, Russia
来源：
INTERNATIONAL WORKSHOP ADVANCED TECHNOLOGIES IN MATERIAL SCIENCE, MECHANICAL AND AUTOMATION ENGINEERING - MIP: ENGINEERING - 2019 | 2019年 / 537卷
关键词：
D O I：
10.1088/1757-899X/537/4/042021
中图分类号：
TH [机械、仪表工业];
学科分类号：
0802 ;
摘要：
The paper discusses the quality diagnostics of electrical radio components based on the results of non-destructive testing. A proposed clustering algorithm does not require preliminary information on the number of classes and the training sample. The algorithm allows to automatically determine the number of classes. The division into classes is due to the different characteristics of the measured variables, which correspond to different product quality ranges.
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页数：5
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