A new approach to optical measurements of small objects with superresolution

被引：3

作者：

Veiko, VP ^{[1
]}

Voznessenski, NB ^{[1
]}

Domnenko, VM ^{[1
]}

Goussev, AE ^{[1
]}

Ivanova, TV ^{[1
]}

Rodionov, SA ^{[1
]}

机构：

[1] Tech Univ, St Petersburg State Inst Fine Mech & Opt, St Petersburg 197011, Russia

来源：

ICONO '98: QUANTUM OPTICS, INTERFERENCE PHENOMENA IN ATOMIC SYSTEMS, AND HIGH-PRECISION MEASUREMENTS | 1999年 / 3736卷

关键词：

nanosized objects; superresolution; secondary light sources; near-field optics;

D O I：

10.1117/12.340137

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

The application of optical superresolution technique to measuring small particles said to be secondary light sources with various scales of sizes - from micrometers to nanometers is discussed. The concept of a separate nanosized object and theoretical approach to recognition of its sizes through the mathematical continuation of the visible angular spectrum of vector plane waves is suggested.

引用

页码：341 / 350

页数：10

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