In-line interferometric femtosecond stimulated Raman scattering spectroscopy

被引：9

作者：

Dobner, Sven ^{[1
]}

Gross, Petra ^{[2
]}

Fallnich, Carsten ^{[1
]}

机构：

[1] Univ Munster, Inst Appl Phys, D-48149 Munster, Germany

[2] Carl von Ossietzky Univ Oldenburg, Inst Phys, D-26129 Oldenburg, Germany

来源：

JOURNAL OF CHEMICAL PHYSICS | 2013年 / 138卷 / 24期

关键词：

INSTRUMENTATION; SENSITIVITY;

D O I：

10.1063/1.4811486

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

We present in-line interferometric femtosecond stimulated Raman scattering (II-FSRS), a new method to measure the spectral Raman intensity and phase over a broad spectral range, potentially in a single shot. An analytic model is developed, that excellently reproduces the measured spectra. Additionally, the performance of II-FSRS is directly compared in experiments to two established techniques, namely femtosecond stimulated Raman scattering and femtosecond Raman induced Kerr-effect spectroscopy. (C) 2013 AIP Publishing LLC.

引用

页数：8

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