Model-Based Temperature Control in Thermal Processing of Silicon Wafers

被引:1
|
作者
Koch, Stefan [1 ]
Schaum, Alexander [2 ]
Kleindienst, Martin [3 ]
Reichhartinger, Markus [4 ]
Meurer, Thomas [2 ]
Moreno, Jaime A. [5 ]
Horn, Martin [1 ]
机构
[1] Graz Univ Technol, Inst Automat & Control, Christian Doppler Lab Model Based Control Complex, Graz, Austria
[2] Univ Kiel, Chair Automat & Control, Kiel, Germany
[3] Lam Res AG, Villach, Austria
[4] Graz Univ Technol, Inst Automat & Control, Graz, Austria
[5] Univ Nacl Autonoma Mexico, Inst Ingn, Mexico City, DF, Mexico
来源
IFAC PAPERSONLINE | 2022年 / 55卷 / 26期
关键词
Distributed-parameter systems; Model-based control; Temperature control; Anti-windup; Input-to-state stability; Manufacturing processes; SYSTEMS;
D O I
10.1016/j.ifacol.2022.10.397
中图分类号
TP [自动化技术、计算机技术];
学科分类号
0812 ;
摘要
The paper proposes a model-based control approach for thermal processing of silicon wafers such as rapid thermal processing. Heating of the wafer is achieved with a large number of high-power LEDs which enable targeted heating over the entire spatial domain. Taking advantage of this feature, a distributed PI controller is first designed assuming an idealized distributed input. This control signal is then approximated by the actual control that enters the system through shape functions using an optimization procedure. A formal analysis of the input-to-state stability with respect to the actuator error, extension with an anti-windup scheme and an experimental validation of the proposed approach are presented. Copyright (C) 2022 The Authors.
引用
收藏
页码:180 / 186
页数:7
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