In-band and out-of-band reflectance calibrations of the EUV multilayer mirrors of the Atmospheric Imaging Assembly instrument aboard the Solar Dynamics Observatory

被引:6
|
作者
Soufli, Regina [1 ]
Spiller, Eberhard [1 ]
Windt, David L.
Robinson, Jeff C. [1 ]
Gullikson, Eric M.
Rodriguez-de Marcos, Luis
Fernandez-Perea, Monica [1 ]
Baker, Sherry L. [1 ]
Aquila, Andrew L.
Dollar, Franklin J.
Antonio Mendez, Jose
Larruquert, Juan I.
Golub, Leon
Boerner, Paul
机构
[1] Lawrence Livermore Natl Lab, Livermore, CA 94550 USA
关键词
EUV multilayers; reflectance measurements; Solar Dynamics Observatory; Atmospheric Imaging Assembly; ABSOLUTE PHOTOABSORPTION MEASUREMENTS; OPTICAL-CONSTANTS; EXTREME-ULTRAVIOLET; THIN-FILMS; SI; SILICON; RANGE; 24-A; MO; AL;
D O I
10.1117/12.927274
中图分类号
V [航空、航天];
学科分类号
08 ; 0825 ;
摘要
Experimental multilayer reflectance data on flight mirrors and witnesses for three extreme ultraviolet (EUV) channels of the Atmospheric Imaging Assembly (AIA) instrument aboard NASA's Solar Dynamics Observatory are presented and compared to theoretical models. The relevance of these results to the performance of the AIA instrument is discussed.
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页数:12
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