A Distributed Electro-thermal Model of AlGaN/GaN HEMT Power-Bar derived from the Elementary Cell Model

被引:0
|
作者
Xiong, A.
Gatard, E.
Charbonniaud, C.
Faqir, M.
Kuball, M.
Buchta, M.
Rochette, S.
Favede, L.
Ouarch, Z.
Floriot, D.
机构
关键词
Electro thermal model; distributed thermal model; AlGaN/GaN power bar; high power amplifier;
D O I
暂无
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
This paper deals with the development of a 120W AlGaN/GaN power bar model starting from the modeling of the elementary cell of the device. The approach consists in coupling a distributed thermal model of the power bar to each electrothermal model of the elementary cells which constitute the power bar. The distributed nature of the temperature is taken into account by mean of a thermal RC network generated from the 3D Finite Element (FE) simulations. These thermal simulations take into account of the non linearity of the thermal conductivity with the temperature and the thermal coupling between the cells. The studied power bar is made of fifteen elementary cells juxtaposed, i.e. 15x(6x400 mu m) AlGaN/GaN HEMT devices. First, a full on wafer characterizations campaign, i.e. pulsed I(V) with pulsed S parameters and load- pull measurements, has been led on the elementary cell devices in order to extract and validate the unitary cell model 6x400 mu m. Then, preliminary stability tests and S parameters have been performed in order to validate the ability to safely measure the power bar mounted on the dedicated test vehicle. Load-pull measurements were then performed on the power bar and compared to the simulations given by the developed power bar model. Finally, a last comparison between the simulation of the High Power Amplifier (HPA) design and its breadboard measurement in L band fully validated the power bar model and the practical methodology used.
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页码:64 / 67
页数:4
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