Power Saving High Performance Deep-Ultraviolet Phototransistors Made of ZnGa2O4 Epilayers

被引:14
|
作者
Shen, Yuan-Chu [1 ]
Huang, Peng-Hsuan [1 ]
Tung, Chun-Yi [1 ]
Huang, Chiung-Yi [1 ]
Tan, Chih-Shan [3 ]
Huang, Yu-Sheng [3 ]
Chen, Lih-Juann [3 ]
He, Jr-Hau [4 ]
Horng, Ray-Hua [1 ,2 ]
机构
[1] Natl Chiao Tung Univ, Inst Elect, Hsinchu 30010, Taiwan
[2] Natl Chiao Tung Univ, Ctr Emergent Funct Matter Sci, Hsinchu 30010, Taiwan
[3] Natl Tsing Hua Univ, Dept Mat Sci & Engn, Hsinchu 30013, Taiwan
[4] City Univ Hong Kong, Dept Mat Sci & Technol, Hong Kong, Peoples R China
关键词
ZnGa2O4; MOCVD; diethylzinc; depletion mode; enhancement mode; DUV photodetectors; phototransistors; THIN-FILM-TRANSISTOR; THICKNESS; MOBILITY; CHANNEL;
D O I
10.1021/acsaelm.9b00820
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Single-crystalline ZnGa2O4 epilayers with different diethylzinc (DEZn) flow rates were successfully grown on sapphire substrates. By decreasing the DEZn flow rate and keeping the deposition time constant, the operational mode of the transistors changed from depletion mode (D-mode) to enhancement mode (E-mode). The relevant electrical properties and physical characteristics are well presented and verified. An E-mode (DEZn = 10 sccm) nchannel thin-film transistor was fabricated for deep-ultraviolet (DUV) phototransistor application. In the phototransistor, the photocurrent gain values increased substantially in the DUV region, the peak value of which measures 1.54 X 10(2) at 240 nm. The superior performance of DUV phototransistors is correlated to the improvement in the quality of materials.
引用
收藏
页码:590 / 596
页数:7
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