X-ray Analysis of MgO Nanoparticles by Modified Scherer's Williamson-Hall and Size-Strain Method

MgO nanoparticles (MgO-NPs) were synthesized using sol-gel method and subsequently annealed at 500 degrees C for two hours. Structural analysis of these synthesized nanoparticles was studied through Rietveld analysis of X-ray diffraction analysis (XRD) pattern. Morphological studies examine the shape and particle size of nanoparticles using scanning electron microscope (SEM) measurement. XRD results revealed the cubic structure with high crystallinity. The morphology of prepared sample were investigated through SEM and showed flakes type morphology. X-ray analysis for broadening of peaks was used to evaluate the crystallite size and lattice strain using Scherer and Williamson-Hall method. The physical parameters such as stress and lattice strain values were calculated more precisely for all the diffraction peaks of XRD using modified form of W-H plot known as uniform deformation model (UDM) and size strain method, respectively. It has been found that Scherer's method gives the rough estimation of the crystallite size of MgO-NPs. The average particle size of MgO-NPs calculated from SEM analysis, Scherer formula and modified form of W-H analysis is highly intercorrelated. (C) 2019 Elsevier Ltd. All rights reserved.