Distribution of surfactants in latex films: A Rutherford backscattering study

被引:23
|
作者
Lee, Wai Peng
Gundabala, Venkata R.
Akpa, Belinda S.
Johns, Michael L.
Jeynes, Chris
Routh, Alexander F.
机构
[1] Univ Sheffield, Dept Chem Engn, Sheffield S1 3JD, S Yorkshire, England
[2] Univ Cambridge, Dept Chem Engn, Cambridge CB2 3RA, England
[3] Univ Surrey, Ion Beam Ctr, Guildford GU2 7XH, Surrey, England
基金
英国工程与自然科学研究理事会;
关键词
D O I
10.1021/la0601760
中图分类号
O6 [化学];
学科分类号
0703 ;
摘要
Uneven distribution of surfactant in dried latex films can affect the final film properties such as its water-resistance, gloss, and adhesiveness. Therefore, it is important to understand the driving force for surfactant transport during drying. In this paper, the accumulation of surfactant on the surface of poly(styrene-co-butyl acrylate) latex is studied using Rutherford Backscattering (RBS) and compared with results from a model that is based on the diffusive transport of particles and surfactant. Experimentally, a 30-50 nm thick surface layer, rich in surfactant, is seen and the concentration in the bulk of the film, obtained from RBS, agrees, at least qualitatively, with the model predictions for two of the surfactants tested.
引用
收藏
页码:5314 / 5320
页数:7
相关论文
共 50 条
  • [1] FTIR STUDY OF THE DISTRIBUTION OF SURFACTANTS IN LATEX FILMS
    KIENTZ, E
    HOLL, Y
    ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY, 1994, 208 : 81 - PMSE
  • [2] DISTRIBUTION OF SURFACTANTS IN LATEX FILMS
    KIENTZ, E
    HOLL, Y
    COLLOIDS AND SURFACES A-PHYSICOCHEMICAL AND ENGINEERING ASPECTS, 1993, 78 : 255 - 270
  • [3] RUTHERFORD BACKSCATTERING SPECTROSCOPY OF POLYIMIDE FILMS
    MATIENZO, LJ
    EMMI, F
    POLYIMIDES : MATERIALS, CHEMISTRY AND CHARACTERIZATION, 1989, : 643 - 657
  • [4] A RUTHERFORD BACKSCATTERING STUDY OF THE STOICHIOMETRY OF THIN THALLIUM IODIDE FILMS
    LING, SC
    BERLINER, R
    BLATT, SL
    SWENSON, OF
    THIN SOLID FILMS, 1980, 67 (01) : 77 - 81
  • [5] AN APPLICATION OF RUTHERFORD BACKSCATTERING TO THE STUDY OF GROWTH OF EVAPORATED-FILMS
    FUJINO, Y
    KANEKO, H
    TAKEDA, Y
    YAMAGUCHI, S
    HIRABAYASHI, M
    NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH, 1981, 191 (1-3): : 177 - 182
  • [6] Study by Rutherford backscattering spectroscopy of the heterostructure of lead titanate thin films
    Martín, MJ
    Calzada, ML
    Mendiola, J
    Da Silva, MF
    Soares, JC
    JOURNAL OF SOL-GEL SCIENCE AND TECHNOLOGY, 1998, 13 (1-3) : 843 - 847
  • [7] Study by Rutherford Backscattering Spectroscopy of the Heterostructure of Lead Titanate Thin Films
    M.J. Martín
    M.L. Calzada
    J. Mendiola
    M.F. Da Silva
    J.C. Soares
    Journal of Sol-Gel Science and Technology, 1998, 13 : 843 - 847
  • [8] RUTHERFORD BACKSCATTERING EXPERIMENTS ON PERCOLATING PD FILMS
    PAPANDREOU, N
    NEDELLEC, P
    TRAVERSE, A
    SOLID STATE COMMUNICATIONS, 1990, 73 (04) : 285 - 287
  • [9] Determination of the element distribution in films deposited using the plasma focus facility by Rutherford backscattering
    Kolokoltsev V.N.
    Kulikauskas V.S.
    Bondarenko G.G.
    Eriskin A.A.
    Nikulin V.Y.
    Silin P.V.
    Journal of Surface Investigation, 2017, 11 (01): : 63 - 68
  • [10] A Study of Raman and Rutherford Backscattering Spectra of Amorphous Carbon Films Modified with Platinum
    Remenyuk, A. D.
    Zvonareva, T. K.
    Serenkov, I. T.
    Sakharov, V. I.
    Perova, T. S.
    Wasyluk, J.
    SEMICONDUCTORS, 2010, 44 (08) : 1074 - 1079