Polymer thin film transistor without surface pretreatment on silicon nitride gate dielectric
被引:6
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作者:
Li, Flora M.
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Univ Waterloo, Waterloo, ON N2L 3G1, CanadaArizona State Univ, Sch Mat, Tempe, AZ 85284 USA
Li, Flora M.
[3
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Dhagat, Parul
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机构:
Arizona State Univ, Sch Mat, Tempe, AZ 85284 USA
Arizona State Univ, Flexible Display Ctr, Tempe, AZ 85284 USAArizona State Univ, Sch Mat, Tempe, AZ 85284 USA
Dhagat, Parul
[1
,2
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Haverinen, Hanna M.
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Univ Oulu, Elect & Informat Engn Dept, Oulu 90014, FinlandArizona State Univ, Sch Mat, Tempe, AZ 85284 USA
Haverinen, Hanna M.
[4
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McCulloch, Iain
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Merck Chem, Southampton S016 7QD, EnglandArizona State Univ, Sch Mat, Tempe, AZ 85284 USA
McCulloch, Iain
[5
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Heeney, Martin
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机构:
Merck Chem, Southampton S016 7QD, EnglandArizona State Univ, Sch Mat, Tempe, AZ 85284 USA
Heeney, Martin
[5
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Jabbour, Ghassan E.
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Arizona State Univ, Sch Mat, Tempe, AZ 85284 USA
Arizona State Univ, Flexible Display Ctr, Tempe, AZ 85284 USAArizona State Univ, Sch Mat, Tempe, AZ 85284 USA
Jabbour, Ghassan E.
[1
,2
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Nathan, Arokia
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UCL, London Ctr Nanotechnol, London WC1H 0AH, EnglandArizona State Univ, Sch Mat, Tempe, AZ 85284 USA
Nathan, Arokia
[6
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机构:
[1] Arizona State Univ, Sch Mat, Tempe, AZ 85284 USA
[2] Arizona State Univ, Flexible Display Ctr, Tempe, AZ 85284 USA
It is well known that surface modification of the gate dielectric in organic thin film transistors (TFTs) plays an important role in device performance, often giving rise to severalfold improvements in field-effect mobility. This paper reports on solution-processed polymer TFTs with mobilities comparable to high performance counterparts despite the absence of dielectric surface pretreatment. An effective mobility of 0.1 cm(2)/V s was obtained with poly(2,5-bis(3-dodecylthiophene-2-yl)thieno[3,2-b]thiophene) transistors on silicon nitride gate dielectric. The results indicate that by judicious preparation of the device layers, one can mitigate the need for dielectric surface pretreatment, thereby reducing fabrication complexity without compromising TFT performance. (c) 2008 American Institute of Physics.