A Method of Reliability Modeling under Stochastic Failure Threshold

被引：0
|
作者：
Jiang Xuepeng [1 ]
Hong Bei [1 ]
机构：
[1] Naval Aeronaut & Astronaut Univ, Yantai 264001, Shandong, Peoples R China
来源：
2017 CHINESE AUTOMATION CONGRESS (CAC) | 2017年
关键词：
Degradation Models; Stochastic Failure Threshold; Uncertainty; Positivistic Approach;
D O I：
暂无
中图分类号：
TP [自动化技术、计算机技术];
学科分类号：
0812 ;
摘要：
Degradation reliability prediction under stochastic failure threshold is studied, The explicit expression of reliability is derived, by charactering the uncertainty of failure threshold with probability distribution. Then, a possibilistic approach for reliability modeling and prediction for degrading components is presented, by use of possibility distribution.
引用
收藏
页码：3776 / 3779
页数：4
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