X-ray photoelectron spectroscopy of nickel dithiolene complex Langmuir-Blodgett films

被引:7
|
作者
Yang, DQ [1 ]
Sun, Y [1 ]
Guo, Y [1 ]
Da, DA [1 ]
机构
[1] Chinese Acad Space Technol, Lanzhou Inst Phys, Lab Appl Surface Phys, Lanzhou 730000, Peoples R China
关键词
XPS; Langmuir-Blodgett films; nickel dithiolene complex; chemical state;
D O I
10.1016/S0169-4332(99)00145-2
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
The chemical states, composition, and structures of monolayer and multilayer Lagmuir-Blodgett (LB) films of a nickel dithiolene (BDN) complex and stearyl alcohol (SA), and BDN powder were characterized using X-ray photoelectron spectroscopy (XPS). The results indicate that Ni atoms mainly exist as Ni2+ in the LB films, while those exist in both Ni2+ and Ni-0 states in pure BDN powder. S-O and Ni-O bonds are more apparent in the XPS spectra of the LB films sample. The study of the peak features of S2p and Ni2p(3/2) with various thickness on silicon (with little silicon oxide surface) substrate indicates that chemisorption occurs in BDN molecules on a Si substrate. The electrical conductivity of BDN hulk and LB films and its relationship with the chemical state were also discussed. (C) 1999 Elsevier Science B.V. All rights reserved.
引用
收藏
页码:196 / 204
页数:9
相关论文
共 50 条
  • [1] X-RAY PHOTOELECTRON-SPECTROSCOPY STUDY OF THE SYNTHESIS OF COPPER SULFIDE IN LANGMUIR-BLODGETT FILMS
    CHEN, HJ
    CHAI, XD
    WEI, Q
    JIANG, YH
    LI, TJ
    THIN SOLID FILMS, 1989, 178 : 535 - 540
  • [2] LANGMUIR-BLODGETT FILMS OF A NICKEL DITHIOLENE COMPLEX ON CHEMICAL MICROSENSORS FOR THE DETECTION OF HYDRAZINE
    GRATE, JW
    ROSEPEHRSSON, S
    BARGER, WR
    LANGMUIR, 1988, 4 (06) : 1293 - 1301
  • [3] Preparation and conductivity of dithiolene complex Langmuir-Blodgett films
    Yang, DQ
    Wang, RF
    Guo, Y
    Da, DA
    JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS, 1999, 10 (07) : 557 - 561
  • [4] INTERACTION OF METALS WITH CADMIUM ARACHIDATE LANGMUIR-BLODGETT FILMS STUDIED BY X-RAY PHOTOELECTRON-SPECTROSCOPY
    SCHRECK, M
    SCHMEISSER, D
    GOPEL, W
    SCHIER, H
    HABERMEIER, HU
    ROTH, S
    DULOG, L
    THIN SOLID FILMS, 1989, 175 : 95 - 101
  • [5] X-ray reflectivity analysis of thin complex Langmuir-Blodgett films
    Poloucek, P
    Pietsch, U
    Geue, T
    Symietz, C
    Brezesinski, G
    JOURNAL OF PHYSICS D-APPLIED PHYSICS, 2001, 34 (04) : 450 - 458
  • [6] Characterization of Langmuir-Blodgett film using differential charging in X-ray photoelectron spectroscopy
    Islam, A. K. M. Maidul
    Mukherjee, M.
    JOURNAL OF PHYSICAL CHEMISTRY B, 2008, 112 (29): : 8523 - 8529
  • [7] Selective generation of defects in polydiacetylene Langmuir-Blodgett films on Si substrates as studied by X-ray photoelectron spectroscopy
    Yamamoto, S
    Ogawa, T
    Mochiji, K
    Tomioka, Y
    JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 1996, 35 (10): : 5453 - 5456
  • [8] ELEMENTAL ANALYSIS OF LANGMUIR-BLODGETT-FILMS BY X-RAY PHOTOELECTRON-SPECTROSCOPY
    KURIHARA, K
    KAWAHARA, T
    SASAKI, DY
    OHTO, K
    KUNITAKE, T
    LANGMUIR, 1995, 11 (04) : 1408 - 1411
  • [9] Quantitative analysis and thickness dependence study of Langmuir-Blodgett films of functionalized platinum nanoparticles by X-ray photoelectron spectroscopy
    Raynal, F
    Etcheberry, A
    Reynaud, C
    Perez, H
    APPLIED SURFACE SCIENCE, 2004, 236 (1-4) : 198 - 207
  • [10] Characterization of polyimide Langmuir-Blodgett films on silver using infrared, Raman and x-ray photoelectron spectroscopies
    Zhao, WW
    Boerio, FJ
    SURFACE AND INTERFACE ANALYSIS, 1998, 26 (04) : 316 - 328