Fabrication of intrinsic Josephson junction of bismuth-based cuprates

被引:4
|
作者
Matsumoto, T. [1 ]
Kashiwaya, H. [1 ]
Shibata, H. [1 ]
Eisaki, H. [1 ]
Yoshida, Y. [1 ]
Yamaguchi, H. [1 ]
Kashiwaya, S. [1 ]
机构
[1] Natl Inst Adv Ind Sci & Technol, Tsukuba, Ibaraki 3058568, Japan
来源
关键词
intrinsic Josephson junction; phase qubit; Bi-2201; Bi-2212;
D O I
10.1016/j.physc.2008.05.162
中图分类号
O59 [应用物理学];
学科分类号
摘要
We have developed a new process for fabricating the intrinsic Josephson junctions of Bi-based cuprates with a size of 1 mu m x 1.7 mu m. The fabricated junctions have an S-shaped structure with four-terminal electrodes that enables us to measure the transport properties of the junctions without considering the effect of the contact resistance. The current-voltage characteristics exhibited clear hysteresis suggesting the absence of serious damage to the insulating layer during the fabrication process. The plasma frequency and crossover temperature were estimated from the parameters extracted from the transport measurements. (c) 2008 Elsevier B.V. All rights reserved.
引用
收藏
页码:1916 / 1918
页数:3
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