Sample-and-hold Imaging for fast scanning in atomic force microscopy

被引：4

作者：

Takahashi, T ^{[1
]}

Ono, S ^{[1
]}

机构：

[1] Univ Tokyo, Inst Ind Sci, Meguro Ku, Tokyo 1538505, Japan

来源：

JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS & EXPRESS LETTERS | 2004年 / 43卷 / 4B期

关键词：

atomic force microscopy; sample-and-hold circuit; fast imaging; quality-factor;

D O I：

10.1143/JJAP.43.L582

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

We have proposed to use a sample-and-hold circuit for direct monitoring of cantilever deflection signals as a novel method for fast imaging in an intermittent contact mode atomic force microscopy (AFM). This method enables us to construct a quasi-topographic image from tip heights at moments when the tip taps on a sample surface. As a result, we obtained the tip height image well corresponding to the sample topography at a scanning rate above 30 Hz/line without any other customization on both a cantilever and a piezo scanner in a commercial AFM system.

引用

页码：L582 / L584

页数：3

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