Characterization of magnetic force microscopy probe tip remagnetization for measurements in external in-plane magnetic fields

被引：12
|
作者：
Weis, Tanja [1 ,3 ]
Krug, Ingo [4 ]
Engel, Dieter [1 ,3 ]
Ehresmann, Arno [1 ,3 ]
Hoeink, Volker [2 ]
Schmalhorst, Jan [2 ]
Reiss, Guenter [2 ]
机构：
[1] Univ Kassel, Inst Phys, D-34132 Kassel, Germany
[2] Univ Bielefeld, Dept Phys Thin Films & Nanostruct, D-33501 Bielefeld, Germany
[3] Univ Kassel, Ctr Interdisciplinary Nanostruct Sci & Technol, D-34132 Kassel, Germany
[4] CEA Saclay, DSM IRAMIS SPCSI, F-91191 Gif Sur Yvette, France
来源：
JOURNAL OF APPLIED PHYSICS | 2008年 / 104卷 / 12期
关键词：
calibration; ion beam effects; magnetic force microscopy; magnetisation;
D O I：
10.1063/1.3040025
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
A quantitative analysis of magnetic force microscopy (MFM) images taken in external in-plane magnetic fields is difficult because of the influence of the magnetic field on the magnetization state of the magnetic probe tip. We prepared calibration samples by ion bombardment induced magnetic patterning with a topographically flat magnetic pattern magnetically stable in a certain external magnetic field range for a quantitative characterization of the MFM probe tip magnetization in point-dipole approximation.
引用
收藏
页数：4
相关论文
共 50 条
  • [1] Characterization of magnetic force microscopy probe tip remagnetization for measurements in external in-plane magnetic fields
    Weis, Tanja
    Krug, Ingo
    Engel, Dieter
    Ehresmann, Arno
    Höink, Volker
    Schmalhorst, Jan
    Reiss, Günter
    Journal of Applied Physics, 2008, 104 (12):
  • [2] Spatial characterization of the magnetic field profile of a probe tip used in magnetic resonance force microscopy
    Nazaretski, E.
    Akhadov, E. A.
    Martin, I.
    Pelekhov, D. V.
    Hammel, P. C.
    Movshovich, R.
    APPLIED PHYSICS LETTERS, 2008, 92 (21)
  • [3] Graphene nanoflakes in external electric and magnetic in-plane fields
    Szalowski, Karol
    JOURNAL OF MAGNETISM AND MAGNETIC MATERIALS, 2015, 382 : 318 - 327
  • [4] Magnetic force microscopy measurements in external magnetic fields-comparison between coated probes and an iron filled carbon nanotube probe
    Wolny, F.
    Muehl, T.
    Weissker, U.
    Leonhardt, A.
    Wolff, U.
    Givord, D.
    Buechner, B.
    JOURNAL OF APPLIED PHYSICS, 2010, 108 (01)
  • [5] Magnetic force microscopy sensors providing in-plane and perpendicular sensitivity
    Muehl, T.
    Koerner, J.
    Philippi, S.
    Reiche, C. F.
    Leonhardt, A.
    Buechner, B.
    APPLIED PHYSICS LETTERS, 2012, 101 (11)
  • [6] Visualizing flux distribution of superconductors in external magnetic fields with magnetic force microscopy
    Pi, UH
    Schwarz, A
    Liebmann, M
    Wiesendanger, R
    Khim, ZG
    Kim, DH
    PHYSICAL REVIEW B, 2006, 73 (14)
  • [7] Numerical Characterization of Magnetic Vortex Probe Imaging for Magnetic Force Microscopy
    Feilhauer, Juraj
    Tobik, Jaroslav
    Soltys, Jan
    Cambel, Vladimir
    IEEE TRANSACTIONS ON MAGNETICS, 2023, 59 (06)
  • [8] Magnetic force microscopy imaging of in-plane magnetic field gradient using transient oscillation
    Saito, H.
    Egawa, G.
    Ishio, S.
    Li, Guoqing
    JOURNAL OF APPLIED PHYSICS, 2008, 103 (07)
  • [9] Artifacts in magnetic force microscopy under in-plane applied magnetic field: Magnetic bubble as a case study
    Cinar, Ibrahim
    Lacour, Daniel
    Montaigne, Francois
    Puliafito, Vito
    Watelot, Sebastien Petit
    Hehn, Michel
    Finocchio, Giovanni
    Ozatay, Ozhan
    Hauet, Thomas
    JOURNAL OF MAGNETISM AND MAGNETIC MATERIALS, 2020, 500
  • [10] Perforated tips for high-resolution in-plane magnetic force microscopy
    Folks, L
    Best, ME
    Rice, PM
    Terris, BD
    Weller, D
    Chapman, JN
    APPLIED PHYSICS LETTERS, 2000, 76 (07) : 909 - 911
12345