New Diagnostic Capabilities of Strain Dependences of Total Integrated Reflectivity of Crystals with Defects. Laue Diffraction in a Thin Crystal

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作者：
Shpak, A. P.
Molodkin, V. B.
Dmitriev, S. V.
Pervak, K. V. Matter
Rudnytska, I. I.
Dinaev, Yu. A.
Niz-Kova, A. I.
Len, E. G.
Bilotska, A. O.
Grankina, A. I.
Kogut, M. T.
Kononenko, O. S.
Katasonov, A. A.
Zabolotny, I. M.
Vasylyk, Ya. V.
Ninichuk, L. L.
Prokopenko, I. V.
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来源：
METALLOFIZIKA I NOVEISHIE TEKHNOLOGII | 2008年 / 30卷 / 07期
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T [工业技术];
学科分类号：
08 ;
摘要：
Within the scope of the dynamical theory of x-ray scattering in crystals with defects of arbitrary sizes for Laue diffraction geometry, the phenomenon model is developed for the total integrated reflective power (TIRP) dependence for 'thin' crystals, which contain defects, on the cylindrical elastic bent degree. Those parameters of this model, which describe the TIRP deformation dependence, are independent on the investigated single-crystal defect structure, but are determined only by the diffraction conditions. However, they proved to be different for the TIRP Bragg and diffuse components. Within the frameworks of the proposed approach, the defect-structure diagnostics of the CZ Si single crystals, which have been annealed at 1080 degrees C during 2, 6 and 8 h, is carried out by the TIRP deformation dependences. The radii and concentrations of defects, which are simultaneously present in crystals, are determined without any artificial limits on its sizes.
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页码：873 / 887
页数：15
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