Design of Adiabatic Logic-Based Energy-Efficient and Reliable PUF for IoT Devices

被引:14
|
作者
Kumar, S. Dinesh [1 ]
Thapliyal, Himanshu [1 ]
机构
[1] Univ Kentucky, Dept Elect & Comp Engn, Lexington, KY 40506 USA
基金
美国国家科学基金会;
关键词
Hardware security; IoT devices; physically unclonable functions (PUFs); adiabatic computing; PHYSICAL UNCLONABLE FUNCTIONS; LIGHTWEIGHT; KEYS;
D O I
10.1145/3390771
中图分类号
TP3 [计算技术、计算机技术];
学科分类号
0812 ;
摘要
Internet of Things (IoT) devices have stringent constraints on power and energy consumption. Adiabatic logic has been proposed as a novel computing platform to design energy-efficient IoT devices. Physically Unclonable Functions (PUFs) is a promising paradigm to solve security concerns such as Integrated Circuit (IC) piracy, IC counterfeiting, and the like. PUFs have shown great promise for generating the secret bits that can be used in the secure systems in an inexpensive way. However, designing a reliable PUF along with energy-efficiency is a big challenge. Therefore, for energy-efficient and reliable PUFs, we are proposing a novel energy-efficient adiabatic logic-based PUF structure. The proposed adiabatic PUF uses energy recovery concept to achieve high energy efficiency and uses the time ramp voltage to exhibit the reliable start-up behavior. The channel length of the transistors play a major role in controlling manufacturing variations. So, in this article, the circuit simulations are performed with 180nm and 45nm Complementary metal-oxide-semiconductor (CMOS) technology in a Cadence Spectre simulator to analyze the impact of channel length variations. The proposed adiabatic PUF has worst-case reliability of 96.84% and 99.6% with temperature variations at 180nm and 45nm CMOS technology, respectively. Further, the proposed adiabatic PUF consumes 1.071fJ/bit-per cycle at 180nm CMOS technology and 0.08fJ/bit-per cycle at 45nm CMOS technology.
引用
收藏
页数:18
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