The surface modification of substrate for roughness improvement

被引:0
|
作者
Huang, Huei Nuan [1 ]
Hung, Cheng Yu [1 ]
Lin, Kun Hung [1 ]
机构
[1] Siliconware Precis Ind Co Ltd, 153 Sec 3,Chung Shan Rd, Taichung 427, Taiwan
关键词
UNDERFILL; PLASMA;
D O I
暂无
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
For assembly process, materials are important like substrate, bump type, UF type. etc. We focus on the surface of substrate in this research. The surface is one of the key factors to widen the process window with same process condition. Roughness will impact the flowing capability of UF dispensing and adhesion. It may cause void issue, poor adhesion and reliability fail. In this study, plasma and descum condition are studied for surface modification of solder mask on substrate; plasma and flux clean times were used to verify the change of surface in assembly process. In order to define the roughness properties, laser microscope, contact angle machine and SEM were used to identify the value of roughness, contact angle and morphology. After plasma process, the roughness has no significant different for all candidates. With flux clean process, it can be improved about 15 similar to 37%.
引用
收藏
页码:378 / 380
页数:3
相关论文
共 50 条
  • [1] LASER MODIFICATION OF THE SURFACE-ROUGHNESS
    ROZNIAKOWSKI, K
    OPTICA APPLICATA, 1993, 23 (2-3) : 155 - 162
  • [2] A phase modification of CdSe electrodeposits induced by substrate roughness
    Bouroushian, M
    Charoud-Got, J
    Loizos, Z
    Spyrellis, N
    JOURNAL OF MATERIALS SCIENCE LETTERS, 2000, 19 (24) : 2201 - 2203
  • [3] Modelling surface roughness improvement in grinding
    Chen, X
    Rowe, WB
    ADVANCES IN MANUFACTURING TECHNOLOGY XII, 1998, : 37 - 42
  • [4] Modelling surface roughness improvement in grinding
    Chen, X
    Rowe, WB
    PROCEEDINGS OF THE INSTITUTION OF MECHANICAL ENGINEERS PART B-JOURNAL OF ENGINEERING MANUFACTURE, 1999, 213 (01) : 93 - 96
  • [5] On the Quantification and Improvement of the Models for Surface Roughness
    Curran, Brian
    Ndip, Ivan
    Guttowski, Stephan
    Reichl, Herbert
    2009 IEEE WORKSHOP ON SIGNAL PROPAGATION ON INTERCONNECTS, 2009, : 67 - 70
  • [6] Effects of the Surface Roughness of a Graphite Substrate on the Interlayer Surface Roughness of Deposited SiC Layer
    Park, Ji Yeon
    Jeong, Myung Hoon
    Kim, Daejong
    Kim, Weon-Ju
    JOURNAL OF THE KOREAN CERAMIC SOCIETY, 2013, 50 (02) : 122 - 126
  • [7] The Effects of the Substrate Surface Roughness on Graphene Plasmons
    Lyon, Keenan A.
    Miskovic, Zoran L.
    ELECTRONIC, PHOTONIC, PLASMONIC, PHONONIC AND MAGNETIC PROPERTIES OF NANOMATERIALS, 2014, 1590 : 163 - 167
  • [8] Control of Wettability of Polymers by Surface Roughness Modification
    Encinas, N.
    Pantoja, M.
    Abenojar, J.
    Martinez, M. A.
    JOURNAL OF ADHESION SCIENCE AND TECHNOLOGY, 2010, 24 (11-12) : 1869 - 1883
  • [9] Cold Plasma for the Modification of the Surface Roughness of Microparticles
    Oguzlu, Hale
    Baldelli, Alberto
    Mohammadi, Xanyar
    Kong, Albert
    Bacca, Mattia
    Pratap-Singh, Anubhav
    ACS OMEGA, 2024, 9 (33): : 35634 - 35644
  • [10] Research on the surface roughness of aramid fibers via the surface modification
    Yang, Dan
    Lin, Wei
    Xin, Binjie
    Miao, Yajing
    Chen, Xiaogang
    JOURNAL OF THE TEXTILE INSTITUTE, 2021, 112 (11) : 1743 - 1752