Dependence of the ferroelectric domain shape on the electric field of the microscope tip

被引:1
|
作者
Starkov, Alexander S. [1 ]
Starkov, Ivan A. [2 ]
机构
[1] Natl Res Univ Informat Technol Mech & Opt, Inst Refrigerat & Biotechnol, St Petersburg 197101, Russia
[2] Brno Univ Technol, Res Ctr 6, Tech 12, Brno 61600, Czech Republic
关键词
SOLID-STATE COOLER; POLARIZATION; GENERATION; NANOSCALE;
D O I
10.1063/1.4927800
中图分类号
O59 [应用物理学];
学科分类号
摘要
A theory of an equilibrium shape of the domain formed in an electric field of a scanning force microscope (SFM) tip is proposed. We do not assume a priori that the domain has a fixed form. The shape of the domain is defined by the minimum of the free energy of the ferroelectric. This energy includes the energy of the depolarization field, the energy of the domain wall, and the energy of the interaction between the domain and the electric field of the SFM tip. The contributions of the apex and conical part of the tip are examined. Moreover, in the proposed approach, any narrow tip can be considered. The surface energy is determined on the basis of the Ginzburg-Landau-Devonshire theory and takes into account the curvature of the domain wall. The variation of the free energy with respect to the domain shape leads to an integro-differential equation, which must be solved numerically. Model results are illustrated for lithium tantalate ceramics. (C) 2015 AIP Publishing LLC.
引用
收藏
页数:7
相关论文
共 50 条
  • [1] Interactions of an atomic force microscope tip with a reversed ferroelectric domain
    Molotskii, M
    Winebrand, E
    PHYSICAL REVIEW B, 2005, 71 (13)
  • [2] Surface charge on ferroelectric thin film by high electric field induced at scanning probe microscope tip
    Son, J. Y.
    Shin, Young-Han
    Lee, Han-Bo-Ram
    Kim, H.
    Cho, J. H.
    Ali, A. I.
    JOURNAL OF THE KOREAN PHYSICAL SOCIETY, 2007, 51 : S125 - S128
  • [3] Dependence of electric field on STM tip preparation
    Huang, DH
    Grey, F
    Aono, M
    APPLIED SURFACE SCIENCE, 1998, 130 : 909 - 913
  • [4] Dependence of electric field on STM tip preparation
    Huang, D.H.
    Grey, F.
    Aono, M.
    Applied Surface Science, 1998, 130-132 : 909 - 913
  • [5] Tip shape dependence of the light emission efficiency for the scanning tunneling microscope
    Uehara, Y
    Suda, Y
    Ushioda, S
    Takeuchi, K
    APPLIED PHYSICS LETTERS, 2001, 79 (11) : 1718 - 1720
  • [6] Dynamics of ferroelectric domain growth in the field of atomic force microscope
    Agronin, A.
    Molotskii, M.
    Rosenwaks, Y.
    Rosenman, G.
    Rodriguez, B.J.
    Kingon, A.I.
    Gruverman, A.
    Journal of Applied Physics, 2006, 99 (10):
  • [7] Dynamics of ferroelectric domain growth in the field of atomic force microscope
    Agronin, A.
    Molotskii, M.
    Rosenwaks, Y.
    Rosenman, G.
    Rodriguez, B. J.
    Kingon, A. I.
    Gruverman, A.
    JOURNAL OF APPLIED PHYSICS, 2006, 99 (10)
  • [8] Ferroelectric charged domain walls in an applied electric field
    Gureev, M. Y.
    Mokry, P.
    Tagantsev, A. K.
    Setter, N.
    PHYSICAL REVIEW B, 2012, 86 (10)
  • [9] Data encoding based on the shape of the ferroelectric domains produced by using a scanning probe microscope tip
    Ievlev, Anton V.
    Kalinin, Sergei V.
    NANOSCALE, 2015, 7 (25) : 11040 - 11047
  • [10] Fracture analysis of ferroelectric single crystals: Domain switching near crack tip and electric field induced crack propagation
    Zhang, Yihui
    Li, Jiangyu
    Fang, Daining
    JOURNAL OF THE MECHANICS AND PHYSICS OF SOLIDS, 2013, 61 (01) : 114 - 130